Invitation

Four years ago it was decided that this SPIE-PL's SOS conference, organized by the Institute of Applied Optics in Warsaw, will be a periodical meeting starting from 2000. Before, the same idea was accepted for another SPIE-PL conference referred to as Lightmetry (L-metry). Four conferences in the series took place: L-metry 2000, L-metry 2002, SOS 2000 and SOS 2001.

Papers were collected and edited by SPIE, Bellingham, USA in following SPIE Volumes:
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, SPIE Vol. 4517,
Lightmetry 2002: Metrology and Testing Techniques Using Light, SPIE Vol. 5064,
Optical Sensing for Public Safety, Health, and Security, SPIE Vol. 4535,
Optical Techniques for Environmental Sensing, Workplace Safety, and Health Monitoring, SPIE Vol. 4887

We invite you cordially to attend our third meeting in the SOS series, present papers, and to contribute to the next SPIE volume. Scope of papers published after our previous meetings you can find in SPIE volumes mentioned above. All persons willing take part in the meeting are asked to deliver Application Form (see next pages) and abstracts of papers before end of October 2003. The conference contributions will be reviewed by the Scientific Committee of the meeting. For regular communicates 20 minutes, including discussion, is foreseen. For invited lectures 45 minutes, including discussion. Official conference language is English. Poster sessions are also planned. Poster area is 3 x 3 A4 sheets.